首页> 外国专利> Testing of structures on surfaces of electrical modules - has structures scanned and tested for observance of salient factors, e.g. spacing, angles, straightness

Testing of structures on surfaces of electrical modules - has structures scanned and tested for observance of salient factors, e.g. spacing, angles, straightness

机译:测试电气模块表面上的结构-扫描并测试结构是否符合显着性因素,例如间距,角度,直线度

摘要

The structure testing method is applicable to structures on surfaces of electrical modules or to auxiliary means for production of the subassemblies. The existing actual structure is scanned and intermediately stored. The structure so obtained is tested for observance of specified constructional rules relating to the structure building, such as syntactic connection between adjacent picture elements. Deviations from the rules indicating structure faults are detected. A practical example is afforded by a mask structure consisting of black regions, in front of a white background. The factors to be tested are accuracy of corner angles, straightness of edges and min. separation of the black regions which can be isolated from each other or interdependent.
机译:该结构测试方法适用于电气模块表面的结构或用于生产子组件的辅助装置。扫描现有的实际结构并进行中间存储。测试如此获得的结构是否遵守与结构建筑物有关的特定构造规则,例如相邻图像元素之间的句法连接。检测到表明结构故障的规则偏差。一个实际的例子是由白色背景前的黑色区域组成的掩模结构。要测试的因素是角的精度,边缘的直线度和最小值。可以彼此隔离或相互依赖的黑色区域的分离。

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