首页> 外文会议>IEEE International Semiconductor Manufacturing Conference >Determining capacity loss from operational and technical deployment practices in a semiconductor manufacturing line
【24h】

Determining capacity loss from operational and technical deployment practices in a semiconductor manufacturing line

机译:在半导体制造线中确定运营和技术部署实践的容量损失

获取原文

摘要

This paper describes a data analysis system that accurately measures the amount of capacity lost from both operational and technical deployment issues. Deployment is defined as instances where WIP is queued in front of a busy tool when another tool, which can run this product, has some idle-no-WIP time. In this case, the idle-no-WIP must be treated as capacity loss because the opportunity to run WIP on the tool with idle time has been lost. This tool combines equipment state data, lot logistic data, and tool restriction data to determine the magnitude of this loss. As a result, meaningful statistics can be obtained about differences in team work methods, the amount of staffing on the floor the consequences of non-optimized tool layout, and the effects of technical restrictions.
机译:本文介绍了一种数据分析系统,可准确测量从操作和技术部署问题丢失的容量。部署被定义为WIP在繁忙工具前排排队的实例,当另一个工具可以运行此产品时具有一些空闲的空闲时间。在这种情况下,idle-no-wip必须被视为容量损失,因为有机会在具有空闲时间的工具上运行WIP的机会已经丢失。该工具结合了设备状态数据,批次逻辑数据和工具限制数据以确定这种损失的大小。因此,可以获得有意义的统计数据关于团队工作方法的差异,地板上的工作人员的数量,非优化工具布局的后果以及技术限制的影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号