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Micromachined VO2-based uncooled IR bolometric detector arrays with integrated CMOS readout electronics

机译:基于微机械的VO2基础加工的UR电压探测器阵列,集成CMOS读数电子器件

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Uncooled IR bolometric detectors fabricated using surface silicon micromachining are presented. The detector fabrication process employs a polyamide sacrificial layer, and a VO$-2$/ thermistor layer exhibiting a thermal coefficient of resistance on the order of $MIN@3 percent/degrees C. Detector sizes are 100 $mu@m $MUL 100 $mu@m and 50 $mu@m $MUL 50 $mu@m, and 64 $MUL 64 and 128 $MUL 128 pixel arrays are fabricate. The detectors exhibit responsivities of up to 15 000 VW$+$MIN@1$/, normalized detectivities typically exceeding 10$+8$/ cm Hz$+1/2$/W$+$MIN@1$/, and response times below 20 ms. Three integrated readout circuit designs for 64 $MUL 64 and 128 $MUL 128 pixel detector arrays, fabricated using a standard 1.5 $mu@m CMOS process,a re described. These circuits include several test and detector nonuniformity correction features and can operate in either self scanning mode at a rate of 30 frames per second, or in the random access mode in which column and row addresses are input directly.
机译:提出了使用表面硅微机械制造的未冷却的IR探测器。探测器制造工艺采用聚酰胺牺牲层,并且Vo $ -2 $ /热敏电阻层呈现出在$ min @ 3%/℃的$ 3%/℃的尺寸上的热阻系数。探测器尺寸为100 $ MU @ MUL 100 $ mu @ m和50 $ mu @ mul 50 $ mu @ m和64 $ mul 64和128 $ mul 128像素阵列是制造的。探测器表现出高达15 000 vw $ + $ min @ 1 $ /,归一化侦探通常超过10 $ + 8 $ / cm Hz $ + 1/2 $ / w $ + $ min @ 1 $ /和响应次数低于20毫秒。三个集成读数电路设计64 $ MUL 64和128 $ MUL 128像素探测器阵列,使用标准的1.5 $ MU @ M CMOS工艺制造,RE描述。这些电路包括多个测试和检测器不均匀性校正特征,并且可以以每秒30帧的速率或在直接输入列和行地址的随机访问模式下以自扫描模式操作。

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