首页> 外文会议>IEEE International Conference on Microelectronic Test Structures >Speed - accuracy trade-off for measurement and characterization of the matching performance of SiGe:C HBTs, applied to a 200 GHz technology
【24h】

Speed - accuracy trade-off for measurement and characterization of the matching performance of SiGe:C HBTs, applied to a 200 GHz technology

机译:Sige:C HBTS匹配性能测量和表征的速度 - 精度折衷速度:C HBT,适用于200 GHz技术

获取原文

摘要

In this paper, the trade-off between time and accuracy for measurement of the matching performance of bipolar transistors has been investigated. After determination of the limits of the hardware setup, the matching behavior of 200 GHz SiGe:C HBTs is characterized over a wide range of dimensions and biasing conditions. The focus is put on measurements in the low and high current region. It reveals the unique bias dependence of bipolar current mismatch in the high current region.
机译:本文研究了对双极晶体管匹配性能的时间和准确性之间的折衷。在确定硬件设置的限制之后,200GHz SiGe的匹配行为:C HBT的特征在于各种尺寸和偏置条件。焦点在低电流区域中进行了测量。它揭示了双极区域在高电流区域中的双极电流失配的独特偏置依赖性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号