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STRESS ASSISTED CONTROLLED FABRICATION OF NANO CHANNELS AND THEIR FLOW CHARACTERISTICS

机译:应力辅助控制纳米通道的制造及其流动特性

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A method to fabricate nano channels narrower than 50nm without the need for any nano lithography is presented. The nano channels are formed by cracking a thin film of silicon dioxide on a silicon substrate by residual stress alone. However, for controlled initiation of cracks on oxide, stress raisers are planted on a silicon substrate by deep RIE. These channels are used to study capillary driven fluid flow through nanochannels. Experimental analysis suggests that the flow rate is inversely proportional to the square root of time, which is in agreement with the theoretical model. From the theoretical plot that fits the experimental data the value of the proportionality constant is determined. From this value it is possible to back calculate the meniscus contact angle if we know the surface energy of the fluid or vice versa.
机译:呈现了在不需要任何纳米光刻的情况下窄于50nm的纳米通道的方法。通过单独的残余应力在硅衬底上裂解硅衬底上的薄膜而形成纳米通道。然而,对于氧化物上的裂缝的受控发起,通过深rie在硅衬底上种植应力升降剂。这些通道用于研究毛细管从动流体流过纳米。实验分析表明,流量与时间的平方根成反比,这与理论模型一致。从拟合实验数据的理论曲线,确定比例常数的值。根据该值,如果我们知道流体的表面能或反之亦然,则可以返回弯月面接触角。

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