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STRESS ASSISTED CONTROLLED FABRICATION OF NANO CHANNELS AND THEIR FLOW CHARACTERISTICS

机译:纳米通道的应力辅助控制制备及其流动特性

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摘要

A method to fabricate nano channels narrower than 50nm without the need for any nano lithography is presented. The nano channels are formed by cracking a thin film of silicon dioxide on a silicon substrate by residual stress alone. However, for controlled initiation of cracks on oxide, stress raisers are planted on a silicon substrate by deep RIE. These channels are used to study capillary driven fluid flow through nanochannels. Experimental analysis suggests that the flow rate is inversely proportional to the square root of time, which is in agreement with the theoretical model. From the theoretical plot that fits the experimental data the value of the proportionality constant is determined. From this value it is possible to back calculate the meniscus contact angle if we know the surface energy of the fluid or vice versa.
机译:提出了一种无需任何纳米光刻即可制造小于50nm的纳米通道的方法。通过仅通过残余应力在硅衬底上使二氧化硅的薄膜破裂来形成纳米通道。然而,为了控制在氧化物上产生裂纹,通过深RIE将应力升高剂植入硅衬底上。这些通道用于研究毛细管驱动的流体通过纳米通道的流动。实验分析表明,流量与时间的平方根成反比,与理论模型吻合。根据适合实验数据的理论图,确定比例常数的值。如果我们知道流体的表面能,则可以从该值反算弯月面接触角,反之亦然。

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