Design of the second-generation scanning photoemission microscope at the National Synchrotron Light Source

摘要

During the past few years, we have built and commissioned a scanning photoemission microscope (X1-SPEM). It was the first photoemission microscope to achieve submicron resolution. To improve the performance, we are designing a second generation instrument. The major changes in the instrument are the replacement of the home-made single pass cylindrical mirror analyzer (CMA) with a hemispherical sector analyzer (HSA) and the construction of a new chamber with a scheme to manipulate the zone plate and the order sorting aperture (OSA) with more flexibility. The design concepts and expected performance of the instrument are discussed.