首页> 外国专利> Laser scanning microscope, semiconductor laser light source unit, scanning unit for a laser scanning microscope, and method of connecting semiconductor light source to scanning microscope

Laser scanning microscope, semiconductor laser light source unit, scanning unit for a laser scanning microscope, and method of connecting semiconductor light source to scanning microscope

机译:激光扫描显微镜,半导体激光光源单元,用于激光扫描显微镜的扫描单元以及将半导体光源连接到扫描显微镜的方法

摘要

A laser scanning microscope according to the present invention is a laser scanning microscope which scans a laser beam on a sample by a scanning optical system in a scanning optical system main body to detect a fluorescence or reflected light from the sample, and a light source section comprising a light source manufactured by a semiconductor process and an optical fiber provided on a radiation side of the light source is incorporated in the scanning optical system main body.
机译:根据本发明的激光扫描显微镜是通过扫描光学系统主体中的扫描光学系统扫描样品上的激光束以检测来自样品的荧光或反射光的激光扫描显微镜,以及光源部分包括通过半导体工艺制造的光源和设置在光源的辐射侧上的光纤的扫描仪光学系统主体中并入有该光纤。

著录项

  • 公开/公告号US7015485B2

    专利类型

  • 公开/公告日2006-03-21

    原文格式PDF

  • 申请/专利权人 JUNICHI KITAGAWA;

    申请/专利号US20030602361

  • 发明设计人 JUNICHI KITAGAWA;

    申请日2003-06-23

  • 分类号G01N21/64;

  • 国家 US

  • 入库时间 2022-08-21 21:42:38

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