Diode laser spectrometer for line profile measurements

摘要

A diode laser spectrometer has been used for high accuracy line profile measurements in 1.7 - 2.4 $mu@m region. Measured lineshapes have been least- square fitted by Voigt profile with floating Gaussian component. Gaussian component pressure dependence resulting from the Dicke narrowing effect is observed. Line intensities, self-induced broadenings and shifts of five water vapor lines near 5475 cm$+$MIN@1$/ are also presented.