Improvements of imaging quality from spread-light analysis in the detector plane of confocal microscopes

摘要

The light intensity distribution in detection planes of laser scanning microscopes contains more information on the object than that which is obtained from the detection of the intensity on the optical axis with ordinary confocal microscopes. We look for simple and fast algorithms to use this additional information for the improvement (e.g., for more precise measurements of positions of edges) of confocal images. Characteristic properties of intensity distribution curves like positions and heights of side lobes are obtained and its values are used for mathematical or logical operations. Quantities resulting from those procedures can show a more sensitive behavior than the usual confocal signal. In this way these quantities are suitable to act as additional parameters in the image processing of confocal images. The example of the measurement of the position of a slit is explained in detail. Some experimental aspects are discussed and an outlook on the effect of defocus is given.