Incremental Circuit and Sensitivity Simulations Using Iterated Timing Analysis Algorithm

摘要

This paper investigates incremental circuit/sensitivity simulations for large-scale MOSFET circuits using the well-known ITA (Iterated Timing Analysis) algorithm. Incremental simulation uses the result waveforms of previous simulation to fasten the simulation speed, which is quite advantageous in the practical "incremental-modifying" circuit design strategy. Most proposed methods have been implemented and tested to justify their advantages.