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Proton Conductivity and Oriented Structure of Nafion Thin Films on the Au-deposited Surface and MgO Substrate

机译:Au沉积的表面和MgO衬底上的质子电导率和裸膜薄膜的结构

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In-plane proton conductivity and interfacial structure of Nafion thin films on the Au-deposited surface and MgO(100) substrate were investigated. Proton conductivity on both Au-deposited and MgO surfaces clearly decreased with decreasing the thickness except the conditions of 80% and 95% relative humidity on the Au-deposited surface. Proton conductivity drop on the MgO substrate was much heavier than that on the Au-deposited surface. Highly oriented structure was observed in both Nafion thin films on the Au-deposited surface and MgO surface by a p-polarized multiple angle incidence resolution spectrometry. While thickness dependent structural change was observed on the Au-deposited surface like the previous reported Nafion thin films on the Pt-deposited surface, thickness dependence of the structural change was not observed markedly on the MgO substrate.
机译:研究了Au沉积的表面和MgO(100)衬底上的Nafion薄膜的平面内质子电导率和界面结构。在Au沉积的和MgO表面上的质子电导率明显降低,随着80%和95%相对湿度的湿度在Au沉积的表面上的情况下,厚度明显降低。 MgO衬底上的质子电导率下降比Au沉积的表面上的更重。通过P偏振的多角度入射率分辨率光谱法在Au沉积的表面和MgO表面上的氮薄膜上观察到高度取向的结构。虽然在沉积的表面上观察到厚度依赖性结构变化,如先前的PT沉积的表面上的先前报道的氮薄膜,但在MgO衬底上没有显着观察结构变化的厚度依赖性。

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