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Effect of Lead frame and Mold Tool Dimension and Tolerance on Lead Burr in Cavity Encapsulation

机译:铅框架和模具刀具尺寸的影响及耐热毛刺在腔封装中的影响

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Over the years, power semiconductor package evolved from normal density lead frame design to high density lead frame design. To catch up the package cost reduction while maintaining its manufacturing quality, tooling design related to lead frame stamping tool and molding tool become more challenging to semiconductor industry. The mismatch between lead frame and mold tool makers' capability has continuously impact to the unit package with various quality incidents; such as pinch copper (lead burr), package offset and etc. To overcome the quality impact, the manufacturing capability of lead frame supplier and mold tool maker has been pushed to the limit. In this paper, the pinch copper (lead burr) study has been done on the delta assessment between lead frame and mold tool capability limitation such as dimension and tolerances. Both lead frame and mold tool have manufacturing tolerance constraints in order for the package to be free from pinch copper and side lead mold flash occurrence. To understand the manufacturing tolerance capabilities, the measurement method on the mold tooling as well as lead frame has been studied and demonstrated prior to any solution imposed. In addition, dimensions and tolerances were identified and defined based on the coefficient of expansion (CTE) matching between lead frame and mold tool material. Based on the CTE chart, the minimum delta tolerance that is allowed between the two materials was illustrated. After confirming the minimum delta tolerance, this is converted into controllable dimension for both lead frame and mold cavity anti flash. Mold cavity positioning and anti-flash dimension has been optimized. New lead frame sample with new control dimension has been manufactured for a feasibility assessment. The feasibility sample showed positive results on pinch copper and side lead mold flash elimination after following the newly defined control dimension. The result was further validated with high volume manufacturing run.
机译:多年来,功率半导体封装从正常密度引线框架设计演变为高密度引线框架设计。为了在保持其制造质量的同时达到包装成本,与铅框架冲压工具和成型工具相关的工具设计变得更具挑战性。引线框架和模具工具制造商能力之间的不匹配与各种质量事件的单位封装不断影响;如捏铜(引线毛刺),封装偏移等,以克服质量的影响,引线框架供应商和模具工具制造商的制造能力已被推到极限。在本文中,在诸如尺寸和公差之类的引线框架和模具工具能力限制之间进行了捏铜(引线毛刺)研究。引线框架和模具工具都具有制造公差约束,以便包装免于夹紧铜和侧铅模具闪光发生。为了了解制造公差能力,在任何施加的任何溶液之前已经研究了模具工具的测量方法以及引线框架。另外,基于引线框架和模具工具材料之间的膨胀系数(CTE)识别和定义尺寸和公差。基于CTE图表,示出了两种材料之间允许的最小Δ容差。在确认最小δ容差之后,将其转换成带框架和模腔防闪光的可控尺寸。模具腔定位和抗闪光尺寸已得到优化。具有新的控制尺寸的新型引线框架样品用于可行性评估。在新定义的控制尺寸之后,可行性样本显示出捏铜和侧铅模具闪光消除阳性结果。结果进一步验证了高卷制造运行。

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