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Contribution of atomic hydrogen flux on H~- ion beam extracted from a negative hydrogen ion source

机译:原子氢气通量对负氢离子源提取的H〜离子束的贡献

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A change in negative hydrogen (H~-) ion current extracted from a cesiated H~- ion source was observed by injecting an amplitude modulated hydrogen atomic beam. A 2.45 GHz microwave power excited hydrogen plasma for injecting atoms to the plasma grid of a multicusp H~- ion source. Under a cesium-free condition, the atom injection increased the extracted H~- ion current by nearly 50 %. The extracted H~- ion current reached 2.5 times the initial value when a small amount of cesium was introduced to the ion source. The microwave plasma injection to the cesiated ion source decreased the extracted H~- ion current by 13 %. The poor H~- ion production by the atom injection can be attributed to a low temperature of the hydrogen atoms produced by the microwave plasma source.
机译:通过喷射振幅调制的氢原子束来观察来自所追溯的H〜离子源的负氢(H〜 - )离子电流的变化。 2.45GHz微波功率激发氢等离子体,用于将原子喷射到多点H〜离子源的等离子体网格。在无铯条件下,原子注射将提取的H〜离子电流增加近50%。当将少量铯引入离子源时,提取的H〜离子电流达到初始值的2.5倍。微波等离子体注射到相对于离子源的注射降低了提取的H〜离子电流13%。原子注射的差H〜离子产生可归因于通过微波等离子体源产生的氢原子的低温。

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