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Research and development of an integrated multi-parameter quartz crystal microbalance and surface plasmon resonance system

机译:集成多参数石英晶体微稳态和表面等离子体共振系统的研究与开发

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We developed a multi-parameter detection system that integrates both a quartz crystal microbalance (QCM) and a surface plasma resonance (SPR) system. A QCM is known to possess the capabilities of measuring both mass loading by frequency shift and stiffness by damping factor of the adsorption layer. However, the mass measured by using a QCM includes not only the true mass of the adsorption layer but also the water. On the other hand, a SPR is a well known technique which can be used to measure the true mass loading of the adsorption layer. By integrating these two techniques, we can simultaneously measure properties such as stiffness, conformation, and mass loading of the adsorption layer. To simplify the chip manufacturing procedures, this new detection system adopts a prism couple method which consists of a He-Ne laser, a prism, quartz and a power meter. In consideration of the light transmission issue, one side of the quartz was coated with ITO instead of gold. Preliminary results showed that this set-up can perform QCM and SPR techniques simultaneously. The experimental results matched well with the theoretical predictions.
机译:我们开发了一种多参数检测系统,其集成了石英晶体微稳态(QCM)和表面等离子体谐振(SPR)系统。已知QCM具有通过吸附层的阻尼因子通过频移和刚度测量质量加载的能力。然而,通过使用QCM测量的质量不仅包括吸附层的真实质量,而且包括水。另一方面,SPR是一种众所周知的技术,可用于测量吸附层的真实载荷。通过整合这两种技术,我们可以同时测量吸附层的刚度,构象和质量负荷等性质。为了简化芯片制造程序,这种新的检测系统采用棱镜耦合方法,该方法由HE-NE激光,棱镜,石英和功率计组成。考虑到光传输问题,石英的一侧涂有ITO而不是黄金。初步结果表明,该设置可以同时执行QCM和SPR技术。实验结果与理论预测相匹配。

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