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Research and development of an integrated multi-parameter quartz crystal microbalance and surface plasmon resonance system

机译:集成式多参数石英晶体微天平和表面等离子体激元共振系统的研究与开发

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We developed a multi-parameter detection system that integrates both a quartz crystal microbalance (QCM) and a surface plasma resonance (SPR) system. A QCM is known to possess the capabilities of measuring both mass loading by frequency shift and stiffness by damping factor of the adsorption layer. However, the mass measured by using a QCM includes not only the true mass of the adsorption layer but also the water. On the other hand, a SPR is a well known technique which can be used to measure the true mass loading of the adsorption layer. By integrating these two techniques, we can simultaneously measure properties such as stiffness, conformation, and mass loading of the adsorption layer. To simplify the chip manufacturing procedures, this new detection system adopts a prism couple method which consists of a He-Ne laser, a prism, quartz and a power meter. In consideration of the light transmission issue, one side of the quartz was coated with ITO instead of gold. Preliminary results showed that this set-up can perform QCM and SPR techniques simultaneously. The experimental results matched well with the theoretical predictions.
机译:我们开发了一个多参数检测系统,该系统集成了石英晶体微天平(QCM)和表面等离子体共振(SPR)系统。已知QCM具有通过频移测量质量负载和通过吸附层的阻尼因数来测量刚度的能力。然而,通过使用QCM测量的质量不仅包括吸附层的真实质量,还包括水。另一方面,SPR是众所周知的技术,可用于测量吸附层的真实质量负载。通过集成这两种技术,我们可以同时测量诸如吸附层的刚度,构象和质量负载之类的属性。为了简化芯片制造程序,这种新的检测系统采用棱镜耦合法,该方法由氦氖激光器,棱镜,石英和功率计组成。考虑到光透射问题,石英的一侧涂有ITO而不是金。初步结果表明,该设置可以同时执行QCM和SPR技术。实验结果与理论预测吻合良好。

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