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Effects on Structural, Electronic Transport Optical Properties of Doped Undoped ZnTe Thin Films for CdTe/CdS Solar Cells

机译:用于CDTE / CDS太阳能电池的掺杂和未掺杂的ZnTe薄膜结构,电子传输和光学性质的影响

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To overcome the naturally existing Schottky barrier problem between p-CdTe and any metal, an intermediate semiconductor thin buffer layer is a better choice prior to the final metallization for contact. Among many investigated back contact materials the ZnTe is suitable as a buffer layer. ZnTe thin films were deposited onto glass substrates by the thermal evaporation technique under vacuum ~2x 10~(-5)mbar. Undoped ZnTe thin films are highly resistive, extrinsic doping of Cu was made to improve the electrical conductivity. Films were doped by immersing in Cu (NO_3)_2- 5H_2O solutions for Cu doping. To optimize the growth parameters the prepared films were characterized using various techniques. The structural analysis of these films was performed by X-ray diffraction (XRD) technique and optical transmission. X-ray diffraction identified the phases present in these films and also observed that the prepared films were polycrystalline. Also the spectral dependence of absorption coefficient was determined from spectrophotometer. Energy band gap index were calculated from obtained optical measurements data.
机译:为了克服P-CDTE和任何金属之间的自然存在的肖特基势垒问题,中间半导体薄缓冲层是在最终金属化接触之前更好的选择。在许多调查的后接触材料中,ZnTe适合作为缓冲层。通过真空〜2×10〜(5)曼巴德的热蒸发技术将ZnTe薄膜沉积在玻璃基板上。未掺杂的ZnTe薄膜具有高电阻,使Cu的外在掺杂,以提高电导率。浸入Cu(NO_3)_2-5H_2O溶液中掺杂薄膜以进行Cu掺杂。为了优化生长参数,使用各种技术表征制备的薄膜。通过X射线衍射(XRD)技术和光学传输进行这些薄膜的结构分析。 X射线衍射鉴定出这些薄膜中存在的相位,并且还观察到制备的薄膜是多晶的。也从分光光度计测定吸收系数的光谱依赖性。从获得的光学测量数据计算能带隙指数。

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