State-of-the-Art Microcontroller EMC Methods An overview

摘要

With increasing tendency automotive, consumer and especially aerospace applications include typically one or more IC or microcontroller. Therefore, the electromagnetic noise increases drastically at a given point and also in total, while the susceptibility of a single device is reduced due to lower threshold voltages. Thus, detailed knowledge of each device's electromagnetic behavior is more crucial than ever. This paper deals with current methods of electromagnetic compatibility measurements of microcontrollers and gives a brief overview on emission (IEC 61967-x) as well as susceptibility (IEC 62132-x) methods for microcontrollers, based on IEC standard specifications developed or approved in VDE AK 767.13.5. Readers will get an impression which method to expect what characteristics from.