Thermography detection of hidden defects

摘要

Thermography measurements allow to detect the defects that may appear undersurface of details with protecting covering. Subsurface defects in the sample have been detected using the high resolution thermal imaging camera FLIR SC7000. To introduce additional energy in a researched sample, a scanning hot air (about 110°C) nozzle is applied (a patent application P.403346). The hidden defect causes a temperature increase in comparison with the remaining area what is a result of changes in emissivity. The results are compared with the pulse thermography method using the xenon lamp for excitation.