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Magnetization reversal processes of epitaxial Fe_3Si films on GaAs(001)

机译:GaAs上外延Fe_3SI薄膜的磁化反转过程(001)

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We report magneto-optical Kerr microscopy study of the magnetic reversal behavior of Fe_3Si/ GaAs(100) epitaxial thin films grown by molecular beam epitaxy. Results are described in the context of superconducting quantum interference device and Kerr effect vector magnetometry to study the magnetic switching behavior. By tuning the Fe concentration of the samples from 75% to 83%, we found that the ratio of uniaxial to cubic anisotropy constants y (= |K_u/K_1|) would tremendously vary from 0.06 to 0.3. When the field was applied along the easy axis of Fe_3Si samples, a step feature was observed in the M-H loops. This feature has been resolved in the domain image by Kerr microscopy, in which we observed a two-switching behavior at the field where the step feature occurred. These can be qualitatively understood by considering the ratio y.
机译:我们报告了通过分子束外延生长的Fe_3Si / GaAs(100)外延薄膜的磁反转行为的磁光kerr显微镜研究。结果在超导量子干涉装置和克尔效应矢量磁度测量中描述以研究磁性开关行为。通过将样品的Fe浓度从75%调节至83%,我们发现单轴与立方体各向异性常数Y(= | K_U / K_1 |)的比率从0.06到0.3的巨大变化。当沿FE_3SI样本的容易轴施加该字段时,在M-H环中观察到阶梯特征。通过KERR显微镜通过KER显微镜在域图像中解析了此功能,其中我们在发生阶梯功能的字段中观察到两个切换行为。通过考虑比率y可以定性地理解这些。

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