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Structural phase transition, electronic and thermoelectric properties of osmium silicide

机译:硅化锇的结构相转变,电子和热电性能

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The structural phase transition, electronic band structure and transport properties of OsSi intermetallic compound have been studied using density functional theory (DFT). The pressure induced phase transition from B_(20) phase to B_2 phase is observed at 5.3 GPa and compared with other theoretical results. The band structures show that OsSi semiconductor in B_(20) phase with indirect band gap of 0.62 eV. We have also studied the transport properties in terms of electrical conductivity (σ/τ) and Seebeck coefficient (S) in the stable (B_(20)) phase. Our results show that OsSi is p-type semiconductor and is in good agreement with the experimental data.
机译:使用密度泛函理论(DFT)研究了OSSI金属间化合物的结构相转变,电子带结构和传输特性。 在5.3GPa下观察到从B_(20)相到B_2相的压力诱导的相转变,并与其他理论结果进行比较。 频带结构表明,B_(20)相中的OSSI半导体,间接带隙为0.62eV。 我们还在稳定(B_(20))相中的电导率(σ/τ)和塞贝克系数方面研究了运输特性。 我们的研究结果表明,OSSI是P型半导体,与实验数据一致。

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