Annealing Induced Structural Changes In Amorphous Co_(23)Fe_(60)B_(17) Film On Mo Buffer Layer

摘要

Structural changes occurring in a thin amorphous Co_(23)Fe_(60)B_(17) film sandwiched between two Mo layers, as a function of thermal annealing has been studied. Thermal stability of the Co_(23)Fe_(60)B_(17) film is found to be significantly lower than the bulk ribbons. SIMS measurements show that during crystallization, boron which is expelled out of the crystallites, has a tendency to move towards the surface. No significant diffusion of boron in Mo buffer layer is observed. This result is in contrast with some earlier studies where it was proposed that the role of buffer layer of refractory metal is to absorb boron which is expelled out of the bcc FeCo phase during crystallization.