Probing Depth Dependent Structure and Magnetic Properties of Thin Films Using Polarized Neutron Reflectivity

摘要

Novel properties of materials produced using nanoscale manufacturing processes often arise from interactions across interfaces between dissimilar materials. In order to understand the physical and magnetic properties of such nanostructures, a thorough and detailed structural and magnetic characterization with interface specificity is required. X-ray reflectivity and polarized neutron reflectivity (PNR) are two nondestructive techniques that provide quantitative measures of the chemical and magnetic depth profiles of the films with less than nanometer resolution averaged over the lateral dimensions of the entire sample (typically 100 mm2). PNR specifically gives simultaneous structure and magnetic information of the interfaces. Unquestionably, neutron reflectivity has played a decisive role in the development and study of new emergent phenomena at interfaces.