Synthesis And Characterization of Electron Doped La_(0.85)Te_(0.15)MnO_3 Thin Film Grown on LaAlO_3 Substrate By Pulsed Laser Deposition Technique

摘要

We report the structural, morphological and magneto-transport properties of electron doped La_(0.85)Te_(0.15)MnO_3 (LTMO) thin film grown on (001) LaAlO_3 single crystal substrate by pulsed laser deposition (PLD). X-ray diffraction (XRD) results confirm that the film has good crystalline quality, single phase, and c-axis orientation. The atomic force microscopy (AFM) results have revealed that the film consists of grains with the average size in a range of 20-30 nm and root-mean square (rms) roughness of 0.27nm. The resistivity versus temperature measurement exhibits an insulator to metal transition (MIT). We have noticed a huge value of magnetoresistance (～93%) close to MIT in presence of 8T field. X-ray photoemission spectroscopy confirms the electron doping and suggests that Te ions could be in the Te~(4+) state, while the Mn ions stay in the Mn~(2+) and Mn~(3+) valence state.