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Study of Microstructure and Electrical Properties of Bulk YBCO Prepared by Melt Textured Growth Technique

机译:熔体纹理生长技术制备的散装YBCO的微观结构和电性能研究

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Bulk YBCO components were prepared using Melt Texture Growth (MTG) technique. Components were fabricated using MTG by addition of Y_2BaCuO_5 (Y211) and Ag to YBCO, which leads to improved grain size without affecting superconducting properties. Green compacts prepared by cold isostatic pressing were pre-sintered at 930°C before subjecting melt texturing. Cooling rates lower than 1 °C.h~(-1) was used, in between (peritectic) temperature of about 995 and 1025°C, to obtain large grained components. Microstructure studies in details were carried out by Scanning Electron Microscope (SEM), Electron Probe Micro Analysis (EPMA), Orientation Imaging Microscope (OIM) and TEM correlated with electrical properties like Critical current density (J_c).
机译:使用熔融纹理生长(MTG)技术制备批量YBCO组分。通过加入Y_2BACUO_5(Y211)和Ag至Ybco,使用MTG制造成分,这导致改善的晶粒尺寸而不影响超导性能。在熔体纹理化之前,通过冷等静压压制制备的绿色块在930℃下预烧结。使用低于1℃的冷却速度,在约995和1025℃的(涂覆)温度之间使用(晶的)温度,得到大的颗粒组分。细节研究详细通过扫描电子显微镜(SEM),电子探针微分析(EPMA),取向成像显微镜(OIM)和TEM与电特性相似,如临界电流密度(J_C)。

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