Comparative Study of Structural, Optical and Impedance Measurements on V_2O_5 and V-Ce Mixed Oxide Thin Films

摘要

Vanadium pentoxide (V_2O_5) and Vanadium-Cerium mixed oxide thin films at different molar ratios of V_2O_5 and CeO_2 have been deposited at 200 W rf power by rf planar magnetron sputtering in pure argon atmosphere. The structural and optical properties were studied by taking X-ray diffraction and transmittance and absorption spectra respectively. The amorphous thin films show an increase in transmittance and optical bandgap with increase in CeO_2 content in as-prepared thin films. The impedance measurements for as-deposited thin films show an increase in electrical conductivity with increase in CeO_2 material.