首页> 外文会议>Canadian Conference on Electrical and Computer Engineering >Design and verification of integrated inductors in CMOS
【24h】

Design and verification of integrated inductors in CMOS

机译:CMOS中集成电感的设计与验证

获取原文

摘要

The design and verification of several monolithic inductor structures is presented. Based on the measurement results of proof-of-concept prototypes in 65 nm CMOS, the inductance (L) and quality factor (Q) of these structures are analyzed both qualitatively and quantitatively. Also, a closed-form approximation for the inductance of vertical spirals is presented and the results are applied to design a compact inductor for serie-speaking at the input of an impedance-matched amplifier.
机译:提出了几种单片电感器结构的设计和验证。基于65nm CMOS中的概念验证原型的测量结果,定性和定量分析这些结构的电感(L)和质量因子(Q)。而且,提出了用于垂直螺旋电感的闭合形式近似,并施加结果以在阻抗匹配的放大器的输入下设计用于SERIE讲的紧凑型电感器。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号