首页> 外文会议>International Symposium on Semiconductor Cleaning Science and Technology >Surface Contamination Removal from Si PV Substrates Using a Biodegradable Chelating Agent and Detection of Cleaning Endpoints Using UV/VIS Spectroscopy
【24h】

Surface Contamination Removal from Si PV Substrates Using a Biodegradable Chelating Agent and Detection of Cleaning Endpoints Using UV/VIS Spectroscopy

机译:使用可生物降解的螯合剂从Si PV基材中除去表面污染,并使用UV / Vis光谱检测清洁终点

获取原文

摘要

The continued pressure for increasing c-Si solar efficiency is generating many innovative and novel approaches. In this manuscript we present the results of a chemical cleaning approach for targeted removal of efficiency degrading metallic contaminants. The application of this cleaning approach, in both alkaline and acidic cleaning processes has demonstrated 0.2 to 0.3% absolute cell efficiency improvement for both mc-Si and c-Si production lines. This improvement is not dependent on cell architectures, but addresses a universal complication arising from crystalline silicon photovoltaic wafering manufacture. We also disclose the potential of utilizing this chemistry to enable a spectroscopic method for real time monitoring of trace metal loading in the cleaning baths. And by extension a method to provide process endpoint detection based on metallic loading levels in aqueous solutions.
机译:增加C-Si太阳能效率的持续压力正在产生许多创新和新颖的方法。在该手稿中,我们介绍了化学清洗方法的结果,用于靶向去除效率降解的金属污染物。这种清洁方法在碱性和酸性清洁方法中的应用已经表现出MC-Si和C-Si生产线的0.2至0.3%的绝对电池效率改善。这种改进不依赖于细胞架构,而是解决了由晶体硅光伏晶片制造产生的通用并发症。我们还公开了利用该化学方法来实现清洁浴中痕量金属载荷实时监测的光谱法。并通过扩展方法基于水溶液中金属加载水平提供过程终点检测的方法。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号