Replication-Based Deterministic Testing of 2-Dimensional Arrays with Highly Interrelated Cells

摘要

In this paper a new method for parallel testing of 2- dimensional arrays is proposed, where test generation is combined with simultaneous circuit partitioning driven by generated test data. The generated tests combine pseudo-exhaustive patterns with deterministic test sequences and are well structured to allow high rate of replication. The test data have a compact structure to be easily unfolded, and they are suitable for implementation as both, software or hardware based BIST. The proposed method targets a large class of sequential (stuck- open and delay) faults and combinational multiple faults. The feasibility of the method is demonstrated by generated test sequences and simulated BIST solutions for array multipliers.