Developments in Instrumentation for Atmospheric Pressure, Nanoscale Chemical Imaging via Tip-Enhanced, Near-Field Desorption/Ionization Mass Spectrometry

摘要

Electron and scanning probe microscopies provide extremely high spatial resolution, albeit with limited chemical information. Secondary ion MS techniques, particularly atomic SIMS, enable sub-micron chemical imaging, but operate under high vacuum. Standard laser desorption/ionization (and ablation coupled with secondary ionization processes) provide molecular information, but have diffraction-limited spatial resolution (i.e., >1 (mu)m). We are currently investigating the potential of near-field laser desorption/ionization MS at atmospheric pressure for nanoscale chemical (molecular imaging).