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Characterization of multiple twinned structural units in pulse-electrodeposited nickel

机译:脉冲电沉积镍中多个孪晶结构单元的特征

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The investigation was performed on pulse-electrodeposited Nickel with sub-microcrystalline microstructure containing slightly elongated grains having a <110> fibre texture in growth direction. Structural units in form of groups of elongated grains possessing a common <110>-zone axis in growth direction and CSL boundaries (in some cases twins) between them have been found in the microstructure by use of EBSD. Grain growth sets in above 325°C but the texture is conserved up to at least 600°C. This means that the arrangement of twins and other CSL boundaries stabilized the structural units; there is no orientation change (by further twinning) when grain growth occurs as seen in previous studies on Ni and Ni-Fe of different initial texture. The observed structural units were characterized in detail and the occurring grains and grain boundaries are described.
机译:对具有亚微晶微晶的脉冲电沉积镍对含有略微细长的晶粒的脉冲电沉积镍进行研究,该颗粒在生长方向上具有<110>纤维质地。通过使用EBSD在微观结构中发现了在生长方向上具有共同的<110> -Zone轴的细长颗粒组的组形细长晶粒形式的结构单元,通过使用EBSD,在微观结构中已经发现它们之间的CSL边界(在某些情况下)。在325°C以上的晶粒生长装置,但纹理达到至少600°C。这意味着双胞胎和其他CSL边界的排列稳定了结构单元;当在先前关于不同初始纹理的Ni和Ni-Fe的研究中看到的谷物生长时,没有取向变化(进一步的孪生)。详细描述了观察到的结构单元,并描述了发生的晶粒和晶界。

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