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Effect of Material Type and Tip Radius of AFM Probes on Nanosheets Groove Machining Accuracy

机译:AFM探头材料型和尖端半径对纳米电池槽加工精度的影响

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This paper presents results of groove machining of potassium niobate nanosheets using an atomic force microscope (AFM). Groove machining operations are performed using recently developed diamond coating (DC) and super sharp silicon (sss) probes. The results obtained using these probes are compared to results obtained using a conventional silicon (Si) probe in order to examine the effects of the material type and the tip radius of the AFM probe on groove machining accuracy.
机译:本文介绍了使用原子力显微镜(AFM)的铌酸钾纳米片的凹槽加工的结果。使用最近开发的金刚石涂层(DC)和超锋利硅(SSS)探针进行沟槽加工操作。将使用这些探针获得的结果与使用常规硅(Si)探针获得的结果进行比较,以检查材料类型和AFM探针的尖端半径对沟槽加工精度的影响。

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