首页> 外文会议>Spanish Conference on ELectron Devices >Analysis of GaAs-Ti thin films deposited by sputtering onto c-Si and GaAs
【24h】

Analysis of GaAs-Ti thin films deposited by sputtering onto c-Si and GaAs

机译:通过溅射沉积的GaAs-Ti薄膜在C-Si和GaAs上分析

获取原文

摘要

Some sputtering processes of GaAs and Ti onto glass, c-Si and c-GaAs substrates have been carried out in order to obtain thin films as candidates to be intermediate band photovoltaic materials. This work presents first results concerning the optical and structural properties of the different deposited thin films.
机译:已经进行了GaAs和Ti的一些溅射过程,用于玻璃,C-Si和C-GaAs基板,以获得作为候选的薄膜作为中间带光伏材料。该工作提出了关于不同沉积的薄膜的光学和结构性质的首先结果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号