Ion Hit Emulation by LASER Beam Model

摘要

The model presented allows the emulation of the space radiation environment that seriously affects the reliable operation of the electronic devices by means of a pulsed laser. The irradiation with a pulsed laser reproduces the voltage variation that occurs in an electronic device subsequent to the passage of an ionizing particle through it. The model establishes the energy and the mass of the ions that can be emulated with the pulsed laser as a function of the laser parameters configuration and the thickness of the active layers.