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Feasibility study of a junction termination using deep trench isolation technique for the realization of DT-SJMOSFETs

机译:利用深沟隔离技术实现DT-SJMOSFET的深沟隔离技术的可行性研究

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In this work, a new design of high voltage (1200 Volts range) power SuperJunction MOSFET (SJMOSFET) is presented: the Deep Trench SJMOSFET (DT-SJMOSFET). Besides, a new junction termination, consisting in a 70μm width and 100 μm depth trench filled by a dielectric, is proposed. Simulation results show that this junction termination exhibits the same blocking voltage capability as the base cell (central cell). In addition, the termination breakdown voltage dependence on the dielectric critical electric field (E{sub}(Cd)) and its permittivity (ε{sub}(rd)) is studied. Finally, the possibility of filling the trench termination using low dielectric polyimide such as BenzoCycloButene (BCB) is successfully approved and the Chemical Mechanical Polishing of BCB is also discussed. These experimental results represent the key steps for a future complete fabrication process of DT-SJMOSFET.
机译:在这项工作中,提出了一种新设计的高电压(1200伏级)功率超结MOSFET(SJMOSFET):深沟SJMOSFET(DT-SJMOSFET)。此外,提出了一种以70μm宽度和100μm深度沟槽组成的新的结终止,由电介质填充。仿真结果表明,该结终止表现出与基池(中央电池)相同的阻塞电压能力。另外,研究了对介质临界电场(e {sub}(cd))及其介电常数(ε{sub}(rd))的终止击穿电压。最后,使用低介电聚酰亚胺(例如苯并环丁烯(BCB)填充沟槽终端的可能性已成功批准,并且还讨论了BCB的化学机械抛光。这些实验结果代表了DT-SJMOSFET的未来完整制造过程的关键步骤。

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