Quantification of Minerals for Quality and Process Control - made easy by XRD (X-ray Diffraction) analysis

摘要

X-ray diffraction (XRD) is a well established method for mineral identification in mineral research, developing new mineral deposits, and industrial quality and process control. Besides mineral identification, grain size determinations, structural investigation, even under changing temperature and pressure conditions, Phase Quantification and study of Nanostructures are the leading subjects in modern XRD Analysis. Traditionally the Absorption-Diffraction Method ("regression method“) was applied for phase quantification by means of conventional single line analysis. In general, when using carefully prepared mineral reference standards, the phase composition of unknown samples could be determined with high accuracy, but in time consuming routines. Alternatives had been the calculation of mineral composition from chemical analysis using the Bogue method or by optical microscopy.