Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits

摘要

This article presents design of specialised aperiodic excitation. Purpose is improvement of fault diagnosis of analog electronic circuits. The goal is enhancement of catastrophic (hard) faults location. Further improvement is achieved after utilising additional feature extraction by means of wavelet transform. Obtained results are compared to fault diagnosis without feature extraction and diagnosis with the simplest aperiodic excitation: step function.