Effects of texture on the properties of polycrystalline HgI_2 films

摘要

Due to different oriented polycrystalline HgI_2 films show different properties. In this paper the properties of different oriented HgI_2 films have been investigated by scanning electron microscopy, X-ray diffraction and current–voltage measurements. The measured results indicate HgI2 films are of high quality and the properties of the (001)-oriented HgI_2 film are better than those of the free oriented ones. The dark current of the (001)-oriented HgI_2 film is 0.5 nA with an applied bias voltage of 40 V. The current of (001)-oriented HgI_2 film keeps unchanged during measurement.