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A Deep Learning Approach for the Identification of Small Process Shifts in Additive Manufacturing using 3D Point Clouds

机译:一种深入学习方法,用于使用3D点云识别小型过程中的小型过程

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Additive manufacturing (AM) refers to a family of manufacturing technologies that fabricate parts by joining materials layer by layer. It has a high level of flexibility in design and manufacturing, which provides a unique opportunity for producing parts with complex geometries that are not feasible using conventional subtractive manufacturing. Due to the sensitivity of AM to machine settings and process conditions, process shifts are oftentimes incurred in AM, which introduce defects and impact the quality and reliability of AM products. As such, it is critical to identify AM process shifts, especially at the incipient stage, for quality assurance. Most existing approaches, however, are limited in their ability to detect small AM process shifts. In this study, a structured light scanner is used to capture 3D point clouds from printed surfaces. A deep learning framework is introduced to extract useful information from point cloud data to delineate geometric variations of the printed surface and detect process shifts. The research methodology is evaluated and validated using both simulation studies and real-world applications. Experimental results have shown that the deep learning approach is with remarkable ability in detecting small process shifts and it outperforms convolutional neural network models when large amounts of training samples are not available. The proposed framework has a strong potential to be used for in-situ layer-wise monitoring of AM processes for quality control and the detection of cyber-physical attacks.
机译:添加剂制造(AM)是指通过层通过层加入材料层来制造零件的制造技术系列。它在设计和制造方面具有高度的灵活性,这为生产具有复杂几何形状的零件提供了独特的机会,这些部件不可能使用传统的减数制造。由于AM到机器设置和工艺条件的敏感性,AM造成的工艺换档是造成的,这引入了缺陷并影响了AM产品的质量和可靠性。因此,识别AM流程班次至关重要,特别是在初期阶段,以获得质量保证。然而,大多数现有方法都受到检测到小AM流程班次的能力的限制。在本研究中,结构化光扫描器用于捕获来自印刷表面的3D点云。引入深度学习框架以从点云数据中提取有用的信息,以描绘印刷表面的几何变体并检测处理偏移。使用模拟研究和现实世界应用来评估和验证研究方法。实验结果表明,深度学习方法具有显着的能力,在检测小过程变速器时,当大量训练样本不可用时,它优于卷积神经网络模型。所提出的框架具有强大的潜力,可用于原位层面监测AM对质量控制和网络物理攻击的检测。

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