Selective XAFS Studies of Functional Materials by Resonant Inelastic X-Ray Scattering

摘要

Lifetime-broadening-suppressed (LBS), state-selective XAFS spectra can be deduced by analyzing resonant inelastic x-ray scattering (RIXS) spectra in terms of a formula derived from the Kramers-Heisenberg equation. By a combination of a third-generation synchrotron source and a spectrometer equipped with large acceptance as well as high-resolution crystals, high quality RIXS data to warrant to extract LBS-XAFS can be collected. LBS-XAFS spectra of CuO nano-particles on ZnO with various Cu concentrations up to as low as 1 mol % are presented and concentration dependence is discussed.