首页> 美国政府科技报告 >Uncovering Selective Excitations using the Resonant Profile of Indirect Inelastic X-Ray Scattering in Correlated Materials: Observing Two-Magnon Scattering and Relation to the Dynamical Structure Factor.
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Uncovering Selective Excitations using the Resonant Profile of Indirect Inelastic X-Ray Scattering in Correlated Materials: Observing Two-Magnon Scattering and Relation to the Dynamical Structure Factor.

机译:利用相关材料中间接非弹性X射线散射的共振轮廓揭示选择性激发:观察双杂散散射及其与动态结构因子的关系。

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摘要

hich has been widely used to study various elementary excitations in correlated and other condensed matter systems. For strongly correlated materials, besides boosting the overall signal the dependence of the resonant profile on incident photon energy is still not fully understood. Previous endeavors in connecting indirect RIXS, such as Cu K-edge for example where scattering takes place only via the core-hole created as an intermediate state, with the charge dynamical structure factor S(q, w) neglected complicated dependence on the intermediate state conguration. To resolve this issue, we performed an exact diagonalization study of the RIXS cross-section using the single-band Hubbard model by fully addressing the intermediate state contribution. Our results are relevant to indirect RIXS in correlated materials, such as high Tc cuprates. We demonstrate that RIXS spectra can be reduced to S(q, w) when there is no screening channel for the core-hole potential in the intermediate state. We also show that two-magnon excitations are highlighted at the resonant photon energy when the core-hoerent intermediate states, such that selecting the exact incident energy is critical when trying to capture a particular elementary excitation.

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