Controlled Cantilever-Tips Adapted form the Scanning Probe Micro-scopies as Active Working Elements in Smart Systems

摘要

Scanning probe microscopies (as atomic force or scanning tunneling microscopy) have revolutionized not only nano-scale analytics but also provided real tools for active working in the nano-world. Despite of this tremendous progress a basic deficiency is preventing a large-scale and even industrial application: there is always only one single element in action. Therefore the method needs to be extended to multiple-tip operation to gain efficiency and speed by proper parallelization. Actually, controlled cantilever-tips are ideal active working elements for smart systems. The huge field of applications covers topographic reading and more complex highly local physical and chemical analysis as well as active interaction with and modification of sample surfaces on the μm, nm and even atomic scale.