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Determination of the neutral gas temperature of nitrogen-containing low-pressure plasmas using a two-temperature model

机译:使用双温模型测定含氮低压等离子体的中性气体温度

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The neutral gas temperature, which is an important process parameter in low-pressure plasmas, is often determined by evaluating the shape of rotational spectra of appropriate molecules. However, the observed population of the rotational levels is determined by the excitation mechanisms and the rotational level population of the electronic states from which the upper electronic state of the chosen molecule band is populated. We used the first negative system of the nitrogen molecule ion for temperature determination in different lowpressure discharges. We will show that the spectra can be fitted best assuming that they are composed of two contributions representing two populations of the nitrogen molecule ion with distinctly different rotational temperatures. Thus, at least two excitation channels of the upper electronic state have to be considered which, in our opinion, are the electron impact on the ground state neutral nitrogen molecule connected with ionization and excitation (rotational level distribution remains essentially unchanged and reflects the gas temperature) and the impact of nitrogen molecules in high vibrational states on the ground-state nitrogen molecule ion (connected with rotational excitation, rotational temperature much higher than the gas temperature). Considering this, more reliable results are obtained compared to the conventional method where a single Boltzmann distribution of the rotational levels is assumed. Here, often, too high temperatures (up to several 100 K) are determined.
机译:作为低压等离子体中的重要过程参数的中性气体温度通常通过评估适当分子的旋转光谱的形状来确定。然而,观察到的旋转水平的群体由填充所选分子带的上部电子状态的电子状态的励磁机构和旋转水平群决定。我们使用氮素分子离子的第一个负系统进行温度测定不同的低压放电。我们将表明,光谱可以最适合假设它们由代表氮素分子离子的两个群体的两种贡献组成,具有明显不同的旋转温度。因此,必须考虑至少两个上部电子状态的激发通道,我们认为,在我们的意见中是对与电离和激发连接的接地状态中性氮素分子的电子撞击(旋转水平分布仍然保持不变并反映气体温度)和氮素分子在高振动状态下的氮分子对地 - 状态氮素分子离子(旋转激发连接,旋转温度高于气体温度)。考虑到这一点,与现有的方法相比,获得了更可靠的结果,其中假设旋转水平的单个Boltzmann分布的传统方法。这里,通常,确定过高的温度(最多100 k)。

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