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High resolution cross section measurementsusing a trap based positron (electron) beam

机译:高分辨率横截面测量基于陷阱的正电子(电子)梁

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The advent of the trap based beam has made possible the highest resolution cross sectionmeasurements of positrons interacting with atoms and molecules to date. The strong magneticfield needed for the trap required new methods of making cross section measurements in such afield. We first describe absolute, integrated inelastic cross section measurements. However, thesetechniques can also be applied to electron scattering and in fact provide some advantages forintegrated electron-impact cross section measurements. Additionally the ability to do both in thesame apparatus minimizes systematic effects in comparative measurements. This paper reports onthe results on the first of these measurements, vibrational excitation in CF_4.
机译:基于陷阱的光束的出现使得迄今为止与原子和分子相互作用的正数的最高分辨率横截积。陷阱所需的强磁场需要在这种偏见中进行横截面测量的新方法。我们首先描述绝对,集成的内部横截面测量。然而,TheSeChniques也可以应用于电子散射,实际上提供了对电子冲击横截面测量的一些优点。另外,在该组织中的确实能力最小化对比测量中的系统效果。本文报告了第一个测量结果的结果,CF_4中的振动激发。

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