首页> 外文会议>European Photovoltaic Solar Energy Conference >EVALUATION OF SERIES RESISTANCE LOSSES IN THE BASE OF SINGLE AND DOUBLE JUNCTION REAR POINT CONTACT SILICON SOLAR CELLS THROUGH SIMULATION AND EXPERIMENT
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EVALUATION OF SERIES RESISTANCE LOSSES IN THE BASE OF SINGLE AND DOUBLE JUNCTION REAR POINT CONTACT SILICON SOLAR CELLS THROUGH SIMULATION AND EXPERIMENT

机译:通过仿真和实验评估单次和双结后点底座和双结后点底座的串联电阻损失

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摘要

Rear point contact (locally diffused) solar cells with double collecting junctions are investigated in this work. Experimental series resistance (R_s) results are presented for two different structures, the double and the single junction solar cell, while the R_s of the cells is compared with theoretical values obtained through 3D simulations. The influence of the additional collecting junction on the back surface to the cell' s series resistance and efficiency is also studied through simulation and experimental data.
机译:在这项工作中研究了具有双收集结的后点接触(本地扩散)太阳能电池。 实验串联电阻(R_S)结果显示为两个不同的结构,双和单结太阳能电池,而细胞的R_S与通过3D仿真获得的理论值进行比较。 还通过模拟和实验数据研究了额外的收集结对电池串联电阻和效率的影响。

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