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Residual stress measurement of gold artefacts by Debye ring analysis

机译:德英环分析的金伪食的残余应力测量

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In the case of precious and rare art manufacts, usually bearing complex geometry, the conventional X-ray Diffraction technique can be very difficult or even impossible to be applied. On the contrary by means of microbeam small area can be analysed and the microstructure of differently treated surfaces can be investigated. Recently, two-dimensional (2D) detectors have been developed for laboratory X-ray diffractometers. Thus, nowadays it is possible to collect high quality diffraction data of a significant part of the diffraction cones during the exposure time and the structure and microstructure of small surface area can be assessed. Moreover, by the analysis of the diffraction cones distortion, the residual and/or applied stresses can be measured. In the present work the structure, microstructure, and residual stress present in representative gold artefacts are discussed mainly on the basis of bidimensional X-ray microdiffraction (μXRD~2) and microfluorescence (μXRF). A gold ring has been analysed before and after deformation and the distribution of residual stress measured along the circumference has been compared with the stress analysis results from FEM simulation.
机译:在珍贵而稀有的艺术品的情况下,通常轴承复杂的几何形状,传统的X射线衍射技术可以非常困难甚至不可能施加。相反,通过微观的小区域可以分析,并且可以研究不同处理的表面的微观结构。最近,已经为实验室X射线衍射计开发了二维(2D)探测器。因此,现在可以在曝光时间期间收集衍射锥的重要部分的高质量衍射数据,并且可以评估小表面积的结构和微观结构。此外,通过分析衍射锥体变形,可以测量残留和/或施加的应力。在本工作中,主要基于均衡的X射线微量微量缩合(μXRD〜2)和微荧光(μXRF),主要讨论了代表性金树艺术品中的结构,微观结构和残余应力。在变形之前和之后已经分析了金环,并且已经将沿周长测量的残余应力分布与FEM模拟的应力分析进行了比较。

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