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The Effect of Firing Temperature on Structure and Electrical Properties in Low Temperature Co-fired Ceramics

机译:烧制温度对低温共铸陶瓷结构和电性能的影响

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An LTCC tape dielectric (A6M) was fired stepwise from 775°C-925°C using standard industry profiles. The fired tapes were investigated for shrinkage, density, crystallization (XRD), composition distribution (SEM/EDS), and high frequency (10 GHz) electrical properties. The tape consists of a glassy material that undergoes crystallization upon firing. Two crystalline phases were observed along with residual glass. Both crystallized phases appear to alter their unit cell dimensions with firing temperature. Fired tape density and XY-shrinkages were stable over the temperature range studied. Electrical properties (ε_r, tan 6) were stable above 825°C including and up to the maximum temperature studied.
机译:使用标准行业型材逐步从775°C-925°C逐步烧制LTCC带电介质(A6M)。研究了燃烧的胶带,用于收缩,密度,结晶(XRD),组成分布(SEM / EDS)和高频(10GHz)电性能。胶带由燃烧时经过结晶的玻璃状材料组成。观察到两种结晶相和残留玻璃。两种结晶阶段似乎都会改变它们的单位电池尺寸与烧制温度。在研究的温度范围内燃烧胶带密度和XY - 收缩率稳定。电气性质(ε_R,棕褐色6)以上825°C稳定,包括研究的最高温度。

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