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Switching rate of magnetoresistive random access memory element: Verifying transition state theory

机译:磁阻随机存取存储器元件的切换速率:验证过渡状态理论

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In this paper we show that the "transition state theory" (TST) used in chemical rate theory works surprisingly well for magnetic systems. It does not work for the simplest case (uniaxial anisotropy), which may explain why it has not previously been applied to other cases such as thin film switching. To check the TST, we develop a method for defining and computing switching rates by Landau-Lifshitz simulation, and apply it to a specific system (thin-film magnetoresistive random access memory element) for which it gives results similar to the TST.
机译:在本文中,我们表明,化学速率理论中使用的“过渡状态理论”(TST)对于磁性系统来说令人惊讶。它不适用于最简单的情况(单轴各向异性),这可以解释为什么它之前未应用于其他情况,例如薄膜切换。要检查TST,我们开发了一种用于通过Landau-Lifshitz仿真定义和计算切换速率的方法,并将其应用于特定系统(薄膜磁阻随机存取存储器元件),其使其与TST类似的结果。

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