首页> 外文会议>IASTED International Conference on Applied Simulation and Modelling >BEHAVIORAL MODELING OF SEMICONDUCTOR DEVICES TAKING INTO ACCOUNT THE THERMOELECTRICAL EFFECT USING VHDL-AMS
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BEHAVIORAL MODELING OF SEMICONDUCTOR DEVICES TAKING INTO ACCOUNT THE THERMOELECTRICAL EFFECT USING VHDL-AMS

机译:vhdl-ams考虑热电效应的半导体器件的行为建模

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The goal of this paper is to describe a methodology for modeling and simulation of thermal effects in semiconductor devices. This paper presents an application of the new standard of VHDL language: VHDL-AMS in the field of thermal effect in semiconductor devices. The principles, techniques and methodology used to achieve the design of an analytical third generation Spice transistor MOS model named EKV are presented, taking into account the thermoelectrical effect with VHDL-AMS, and with relevant parameters set to match a deep submicron technology. The models were validated using System Vision software from Mentor Graphics.
机译:本文的目标是描述半导体器件中热效应的建模和模拟方法。本文介绍了新标准的VHDL语言标准:VHDL-AMS在半导体器件中的热效应领域。介绍了用于实现名为EKV的分析第三代SPICE晶体管MOS模型的原理,技术和方法,考虑到VHDL-AMS的热电效果,以及匹配深亚微米技术的相关参数。使用来自Mentor图形的系统视觉软件验证了模型。

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