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Rapid diagnostics of an ASIC IP block using dynamic laser scanning

机译：使用动态激光扫描快速诊断ASIC IP块的诊断

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Recently a powerful class of failure analysis techniques based on dynamic laser stimulation (DLS) of operating ICs has been developed. DLS techniques include soft-defect localization (SDL), in which a 1.3/spl mu/m laser locally heats the device, and laser-assisted device alteration (LADA), in which a 1.06 /spl mu/m laser injects photocurrent. In this paper we report the use of DLS to locate a marginal circuit in an IP memory block on an advanced graphics ASIC with 0.11 /spl mu/m technology.

机译：最近，已经开发出基于动态激光刺激（DLS）的操作IC的强大失败分析技术。 DLS技术包括软缺陷定位（SDL），其中1.3 / SPL MU / M激光器局部加热器件，激光辅助装置改变（LADA），其中1.06 / SPL MU / M激光器注射光电流。在本文中，我们报告使用DLS在高级图形ASIC上定位在IP存储器块中的边缘电路，以0.11 / SPL MU / M技术。

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《International Symposium on the Physical and Failure Analysis of Integrated Circuits 》|2005年||共5页
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作者
Liao J.Y.; Xiaoding Chen; Marks H.L.; Nishizaki C.; Woods G.L.; Vedagarbha P.; Nataraj N.;
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中图分类 TN43-53;
关键词
application specific integrated circuits; failure analysis; fault diagnosis; integrated circuit testing; laser beam applications; photoconductivity; 0.11 micron; 1.06 micron; 1.3 micron; ASIC IP block; IP memory; advanced graphics ASIC; application specific integrat;

机译：应用特定集成电路;故障分析;故障诊断;集成电路测试;激光束应用;光电导率;0.11微米;1.06微米;1.3微米;ASIC IP块;IP内存;Advanced图形adad;

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专利

1. Rapid diagnostics of ASIC circuit marginalities using dynamic laser stimulation [J] . Liao J.Y., Woods G.L., Marks H.L. IEEE transactions on device and materials reliability . 2006 ,第1期

机译：使用动态激光刺激快速诊断ASIC电路裕度
2. Scanned- and Fixed-Wavelength Absorption Diagnostics for Combustion Measurements Using Multiplexed Diode Lasers [J] . D. S. Baer, V. Nagali, E. R. Furlong AIAA Journal . 1996 ,第3期

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4. Rapid diagnostics of an ASIC IP block using dynamic laser scanning [C] . Liao, J.Y., Xiaoding Chen, . 2005

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8. RAPID SCAN LASER LINEWIDTH DIAGNOSTIC INSTRUMENT [R] . J. R. Smith 1977

机译：快速扫描激光线宽诊断仪器

Rapid diagnostics of an ASIC IP block using dynamic laser scanning

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